Scanning Electron Microscopy And X-ray Microanalysis: Third Edition
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Estoque: 1 Marca: FBOOK COMERCIO DE LIVROS E REV Referência: 9780306472923
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
- Ano de publicação: 2003
- Peso: 1750
- Formato: Livro
- Autor: MARK STANIFORTH
- Edição: 3
- Encadernação: Capa Dura
- Origem: Importado
- Páginas: 690
- Marca: FBOOK COMERCIO DE LIVROS E REV